Electron backscatter diffraction (EBSD) is used to investigate crystal lattice rotation caused by plastic deformation during high-strain rate laser shock peening in single crystal aluminum and copper sample on and (001) surfaces. New experimental methodologies are employed which enable measurement of the in-plane lattice rotation under approximate plane-strain conditions. Crystal lattice rotation on and below the microscale laser shock peened sample surface was measured and compared with the simulation result obtained from FEM analysis, which account for single crystal plasticity. The lattice rotation measurements directly complement measurements of residual strain/stress with X-ray micro-diffraction using synchrotron light source and it also gives an indication of the extent of the plastic deformation induced by the microscale laser shock peening.
Characterization of Plastic Deformation Induced by Microscale Laser Shock Peening
Contributed by the Applied Mechanics Division of THE AMERICAN SOCIETY OF MECHANICAL ENGINEERS for publication in the ASME JOURNAL OF APPLIED MECHANICS. Manuscript received by the ASME Applied Mechanics Division, September 4, 2003; final revision, April 29, 2004. Associate Editor: K. M. Liechti. Discussion on the paper should be addressed to the Editor, Prof. Robert M. McMeeking, Journal of Applied Mechanics, Department of Mechanical and Environmental Engineering, University of California–Santa Barbara, Santa Barbara, CA 93106-5070, and will be accepted until four months after final publication of the paper itself in the ASME JOURNAL OF APPLIED MECHANICS.
Chen , H., Kysar , J. W., and Yao, Y. L. (November 9, 2004). "Characterization of Plastic Deformation Induced by Microscale Laser Shock Peening ." ASME. J. Appl. Mech. September 2004; 71(5): 713–723. https://doi.org/10.1115/1.1782914
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