This article presents a side electromechanical instability of slender comb-fingers in MEMS electrostatic devices. Two models are developed for predicting such side pull-in of comb-fingers; one is based in the lumped modeling technique and another is developed by FEM approach. In the slender finger array, the deflection of every finger and pull-in voltage can be calculated by the models. Results indicate every comb-finger bends with different amplitudes. In the finger array, few sided fingers are strongly deflected, the extreme sided fingers in particular, while other inner fingers show negligible deformations. We suggest these extreme sided fingers can dominate the side pull-in of the comb-fingers and should be considered with careful device design by employing the proposed models in this paper.
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ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 3–6, 2008
Brooklyn, New York, USA
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4328-4
PROCEEDINGS PAPER
Modeling and Stability Analysis of Comb-Fingers in MEMS Electrostatic Actuators
Yang-Che Chen,
Yang-Che Chen
National Tsing-Hua University, HsinChu, Taiwan
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Ian Chao-Ming Chang,
Ian Chao-Ming Chang
National Tsing-Hua University, HsinChu, Taiwan
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Rongshun Chen,
Rongshun Chen
National Tsing-Hua University, HsinChu, Taiwan
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Max Ti-Kuang Hou
Max Ti-Kuang Hou
National United University, MiaoLi, Taiwan
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Yang-Che Chen
National Tsing-Hua University, HsinChu, Taiwan
Ian Chao-Ming Chang
National Tsing-Hua University, HsinChu, Taiwan
Rongshun Chen
National Tsing-Hua University, HsinChu, Taiwan
Max Ti-Kuang Hou
National United University, MiaoLi, Taiwan
Paper No:
DETC2008-49731, pp. 641-646; 6 pages
Published Online:
July 13, 2009
Citation
Chen, Y, Chang, IC, Chen, R, & Hou, MT. "Modeling and Stability Analysis of Comb-Fingers in MEMS Electrostatic Actuators." Proceedings of the ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems. Brooklyn, New York, USA. August 3–6, 2008. pp. 641-646. ASME. https://doi.org/10.1115/DETC2008-49731
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